Conference Sessions

Preliminary conference program, subject to possible modifications

ENGLISH LANGUAGE CONFERENCE SESSIONS

Session 1 (half day)

Chair: Aram Khalil-Pour, Engineering Services/Asset Management, FortisBC, Canada

Issues & Challenges Confronting Asset Management

Session 2 (full day)

Chair: Igor Gutman, Senior Expert, Independent Insulation Group, Sweden

Increasing Confidence in Transmission Line & Substation Insulators

Session 3 (half day)

Chair: Alberto Pigini, High Voltage Engineering Senior Consultant, Italy

Application of RTV Silicone Coatings to HV Insulators: Latest Experience, Standards & Guidelines for Assessing End-of-Life

Session 4 (half day)

Chair: TBD

Advances & State-of-the-Art in Condition Monitoring of Surge Arresters & Bushings

Session 5 (half day)

Chair: Florent Giraudet, Metarresters, Germany

Optimized Application of Surge Arresters to Reduce Lightning Disturbances on Overhead Lines

Session 6 (half day)

Chair: Lars Jonsson, Hitachi Energy, Sweden

Optimizing Selection, Application & Testing of MV & HV Bushings

Session 7 (half day)

Chair: TBD

Application of Artificial Intelligence & Optimizing Inspection of Overhead Lines & Components

Session 8 (full day)

Chair: Paul Leufkens, Leufkens Power Projects, United States

Latest Knowledge & Experience in Testing & Condition Assessment of Power Cables & Accessories


SPANISH LANGUAGE CONFERENCE SESSIONS

Session 9 (full day) – Chair: Samuel Arturo Asto Soto, RED Eléctrica de Perú

Evaluación del entorno de servicio de líneas aéreas/subestaciones y optimización del rendimiento del aislador en entornos contaminados

Session 10: (half day) – Chair: TBD

Optimización del diseño, aplicación y monitoreo de condición de bujes de MT y AT

Session 11 (half day) – Chair: TBD

Optimización de la aplicación de pararrayos de línea para reducir las perturbaciones causadas por rayos y evaluación del estado de los pararrayos de alta tensión de clase estación

Session 12 (half day) – Chair: TBD

Pruebas y evaluación del estado de cables de alimentación de MT y AT